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Applied Physics A: Materials Science and Processing

Volumn 100, Issue 4, 2010, Pages 1205-1209

Phase evolution, Raman spectroscopy and microwave dielectric behavior of (Li1/4Nb3/4) doped ZrO2-TiO2 system

(5) Pang, Li Xia a,b Wang, Hong a Zhou, Di a Chen, Yue Hua a Yao, Xi a

a XI'AN JIAOTONG UNIVERSITY (China)

b XI'AN TECHNOLOGICAL UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMMENSURATE STRUCTURE; CRYSTALLINE PHASIS; DIELECTRIC CONSTANTS; ELECTRON DIFFRACTION ANALYSIS; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; NEGATIVE VALUES; PHASE EVOLUTIONS; QUALITY FACTORS; RAMAN ANALYSIS; RAMAN PEAK; SECONDARY PHASE; TEMPERATURE COEFFICIENT; TIO; VIBRATION MODES; ZR/TI RATIO;

CERAMIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

ZIRCONIUM ALLOYS;

EID: 84755160649 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-010-5838-2 Document Type: Article

Times cited : (11)

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