Oxygen incorporation in porous thin films of strontium doped lanthanum ferrite

Journal of Electroceramics

Volumn 27, Issue 3-4, 2011, Pages 134-142

  Søgaard, Martin ^a   Bieberle Hütter, Anja ^b   Hendriksen, Peter Vang ^a   Mogensen, Mogens ^a   Tuller, Harry Louis ^c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b ETH ZURICH   (Switzerland)

^c Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Conductivity relaxation; LSF; Oxygen reduction kinetics; Sensors; Solid oxide fuel cells; Thin film

Indexed keywords

BULK SAMPLES; CONDUCTIVITY RELAXATION; CONSTANT TEMPERATURE; CUBIC PEROVSKITE; ELECTRICAL CONDUCTIVITY; EXCHANGE COEFFICIENTS; IONIC DEFECTS; LANTHANUM FERRITES; LSF; MGO(1 0 0); OXYGEN INCORPORATION; OXYGEN REDUCTION KINETICS; POROUS THIN FILMS; SOLID OXIDE; SURFACE EXCHANGE COEFFICIENTS; TEMPERATURE RANGE; THERMAL HISTORY; WAVELENGTH DISPERSIVE X-RAYS;

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY; ELECTROLYTIC REDUCTION; INTERNET PROTOCOLS; ION EXCHANGE; IRON OXIDES; LANTHANUM; OXYGEN; PEROVSKITE; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SENSORS; STRONTIUM; THIN FILMS; VAPOR DEPOSITION; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY DIFFRACTION;

SURFACE MORPHOLOGY;

EID: 84655170072     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-011-9658-3     Document Type: Article

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