Use of weighting algorithms to improve traditional support vector machine based classifications of reflectance data

Optics Express

Volumn 19, Issue 27, 2011, Pages 26816-26826

  Qi, Bin ^a   Zhao, Chunhui ^a   Youn, Eunseog ^b   Nansen, Christian ^c,d  

^a HARBIN ENGINEERING UNIVERSITY   (China)

^b Department of Electrical and Computer Engineering   (United States)

^c TEXAS A AND M UNIVERSITY   (United States)

^d UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; REFLECTION; SUPPORT VECTOR MACHINES; VECTORS;

ADVERSE EFFECT; CLASSIFICATION ACCURACY; CORN KERNELS; FEATURE WEIGHTING; HUGHES PHENOMENON; HYPERSPECTRAL REFLECTANCE; INBRED LINE; LAND COVER; PUBLIC DATA; REDUNDANT FEATURES; REFLECTANCE DATA; SPECTRAL BAND; WEIGHTING METHODS;

CLASSIFICATION (OF INFORMATION);

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; METHODOLOGY; PHOTOMETRY; SPECTROSCOPY; SUPPORT VECTOR MACHINE;

ALGORITHMS; PATTERN RECOGNITION, AUTOMATED; PHOTOMETRY; SPECTRUM ANALYSIS; SUPPORT VECTOR MACHINES;

EID: 84555223724     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.026816     Document Type: Article

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