Monte Carlo simulation methods for computing the wetting and drying properties of model systems

Journal of Chemical Physics

Volumn 135, Issue 23, 2011, Pages

  Rane, Kaustubh S ^a   Kumar, Vaibhaw ^a   Errington, Jeffrey R ^a  

^a the State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL STRATEGY; DIRECT MEASURES; DRYING METHODS; ENSEMBLE TECHNIQUES; INTERFACE POTENTIALS; INTERFACIAL PROPERTY; LENNARD JONES FLUID; LIQUID-VAPOR SURFACES; MODEL SYSTEM; MONTE CARLO SIMULATION METHODS; SPREADING COEFFICIENTS; STATE POINTS; SUBSTRATE POTENTIAL; SURFACE EXCESS; THIN FLUID FILMS; THIN LIQUID FILM; TWO MODEL SYSTEMS; VAPOR FILMS; WETTING AND DRYING;

COMPUTER SIMULATION; CONTACT ANGLE; DRYING; FILM GROWTH; FLUIDS; FREE ENERGY; LIQUID FILMS; SUBSTRATES; SURFACE PROPERTIES; SURFACE TENSION; VAPORS; WETTING;

MONTE CARLO METHODS;

EID: 84555202604     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3668137     Document Type: Article

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