On fault deletion problem in concurrent fault simulation for synchronous sequential circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn 1992-April, Issue , 1992, Pages 125-130

  Kim, K ^a   Sajuja, K K ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEQUENTIAL CIRCUITS; TIMING CIRCUITS; VLSI CIRCUITS;

CONCURRENT FAULT SIMULATION; CONCURRENT SIMULATION; FAULT SIMULATORS; SYNCHRONOUS SEQUENTIAL CIRCUITS;

SWITCHING CIRCUITS;

EID: 8444235855     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.1992.232736     Document Type: Conference Paper

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