VUV photoemission using synchrotron light: A tool for characterising surfaces and interfaces occurring in OLEDs

Journal of Alloys and Compounds

Volumn 382, Issue 1-2, 2004, Pages 179-186

  Ghijsen, J ^a   Johnson, R L ^b   Elschner, A ^c   Koch, N ^d  

^a UNIVERSITY OF NAMUR   (Belgium)

^b UNIVERSITY OF HAMBURG   (Germany)

^c BAYER AG   (Germany)

^d HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Energy level alignment; Organic semiconductors; Photoelectron spectroscopy

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRONS; FERMI LEVEL; LIGHT EMITTING DIODES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SORPTION; SPIN COATING; VACUUM APPLICATIONS;

ENERGY ALIGNMENT; HOLE INJECTION; ORGANIC MATERIALS; PHYSISORPTION;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 8444233997     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.05.050     Document Type: Conference Paper

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