Acceleration method for gate-disturb degradation on embedded flash EEPROM

Microelectronics Reliability

Volumn 40, Issue 8-10, 2000, Pages 1279-1283

  Wada, Tetsuaki ^a  

^a Semiconductor Company   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8444232130     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00135-9     Document Type: Article

References (5)

1. G.Verma and N.Mielke ; 1988 IRPS p.158
2. A.Brand et. ; 1993 IRPS p. 127
3. Y.C.Lin et. ; 1997 IRPS p.97
4. B. De Salvo ; 1999 IRPS p.19
5. Z. A. Weinberg, 1982 J. Appl. Phys. p.5052