X-ray photon correlation spectroscopy in systems without long-range order: Existence of an intermediate-field regime

Journal of Synchrotron Radiation

Volumn 19, Issue 1, 2012, Pages 66-73

  Ludwig, Karl ^a  

^a Boston University   (United States)

Author keywords

X ray diffraction; X ray photon correlation spectroscopy

Indexed keywords

CORRELATION FUNCTION; ENSEMBLE AVERAGES; ENSEMBLE-AVERAGED; FAR-FIELD; FAR-FIELD DIFFRACTION; FRAUNHOFER; INCIDENT BEAMS; INTERMEDIATE REGIMES; LENGTH SCALE; LONG RANGE ORDERS; PARAMETER SPACES; PHOTON WAVELENGTH; PIXEL SIZE; POWER DENSITIES; SAMPLE-TO-DETECTOR DISTANCE; SCATTERED INTENSITY; STRUCTURAL CORRELATION; STRUCTURE FACTORS; THERMAL IMPACTS; TIME-DEPENDENT DYNAMICS; VARIABLE FOCUSING; X RAY PHOTON CORRELATION SPECTROSCOPY;

CORRELATION METHODS; ELECTRIC FIELDS; FREE ELECTRON LASERS; PHOTONS; QUANTUM OPTICS; RADIATION DAMAGE; X RAY DIFFRACTION;

PHOTON CORRELATION SPECTROSCOPY;

EID: 84255192564     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049511040532     Document Type: Article

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