Resonant soft x-ray scattering from stepped surfaces of SrTiO 3

Journal of Physics Condensed Matter

Volumn 24, Issue 3, 2012, Pages

  Schlappa, J ^a,b   Chang, C F ^a,c   Hu, Z ^a,c   Schierle, E ^b,d   Ott, H ^a   Weschke, E ^b,d   Kaindl, G ^d   Huijben, M ^e   Rijnders, G ^e   Blank, D H A ^e   Tjeng, L H ^a,c   Schuler Langeheine C ^a,b  

^a UNIVERSITY OF COLOGNE   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

^d FREIE UNIVERSITÄT BERLIN   (Germany)

^e UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION ANGLE; DIFFRACTION PEAKS; ENERGY DEPENDENCE; MODEL SYSTEM; OPTICAL PARAMETER; RESONANT DIFFRACTION; SOFT X-RAY; SPECTROSCOPIC PROBES; SPECULAR REFLECTIVITY; SRTIO; STEPPED SURFACES; TOTAL REFLECTION;

STRONTIUM ALLOYS; STRONTIUM TITANATES; X RAY ABSORPTION; X RAY DIFFRACTION;

REFLECTION;

EID: 84255171557     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/3/035501     Document Type: Article

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