Simultaneous scatterer shape estimation and partial aperture far-field pattern denoising

Communications in Computational Physics

Volumn 11, Issue 2, 2012, Pages 271-284

  Olshansky, Yaakov ^a   Turkel, Eli ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Far field pattern; Scattering inverse problem

Indexed keywords

EID: 84055193460     PISSN: 18152406     EISSN: 19917120     Source Type: Journal    
DOI: 10.4208/cicp.181109.011210s     Document Type: Conference Paper

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