A dual mode redundant approach for microprocessor soft error hardness

IEEE Transactions on Nuclear Science

Volumn 58, Issue 6 PART 1, 2011, Pages 3018-3025

  Clark, Lawrence T ^a   Patterson, Dan W ^a   Hindman, Nathan D ^a   Holbert, Keith E ^a   Maurya, Satendra ^a   Guertin, Steven M ^b  

^a Arizona State University   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Dual mode redundancy; error correction; radiation hardening; register files; sequential logic circuits; single event effects; soft errors; total ionizing dose

Indexed keywords

REGISTER FILES; SEQUENTIAL LOGIC CIRCUITS; SINGLE EVENT EFFECTS; SOFT ERROR; TOTAL IONIZING DOSE;

ERROR CORRECTION; HARDENING; IONIZING RADIATION; MICROPROCESSOR CHIPS; RADIATION HARDENING; TRANSIENTS;

LOGIC CIRCUITS;

EID: 83855162254     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2011.2168828     Document Type: Conference Paper

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