Mechanisms leading to single event upset

IEEE Transactions on Nuclear Science

Volumn 33, Issue 6, 1986, Pages 1577-1580

  Axness, C L ^a   Weaver, H T ^a   Fu, J S ^a   Koga, R ^b   Kolasinski, W A ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8344286933     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1986.4334644     Document Type: Article

References (10)

1. J. S. Fu, C. L. Axness, and H. T. Weaver, “Memory SEU Simulations Using 2-D Transport Calculations”, Elec. Dev. Lett. EDL-6, 422 (1985).
2. C. M. Hsieh, P. C. Murley, and R. R. O'Brien, “A Field-Funneling Effect on the Collection of Alpha-Generated Generated Carriers in Silicon Devices”, IEEE Elect. Dev. Lett., EDL-2, 103 (1981).
3. C. L. Axness, H. T. Weaver, and J. S. Fu, “Two-Dimensional Dimensional Simulation of Single Event Upsets in SEU-Hardened CMOS RAM Cells”, Proc. of the NASECODE IV Conference, Dublin, June 1985.
4. T. M. Mnich, S. E. Diehl, B. D. Shafer, R. Koga, W. A. Kolasinski, A. Ochoa, Jr. “Comparison of Analytical Models and Experimental Results for Single Event Upset in CMOS SRAM”, IEEE Trans. Nuc. Sci., NS-30, 4620 (1983).
5. J. S. Fu, H. T. Weaver, R. Koga, W. A. Kolasinski, “Comparsion of 2D Memory SEU Transport Simulation with Experiments”, IEEE Trans. Nuc. Sci. NS-32, 4145(1985).
6. J. S. Browning, R. Koga, W. A. Kolasinski, “Single Event Upset Rate Estimates for a 16K CMOS SRAM”, IEEE Trans. Nuc. Sci. NS-32, 4133 (1985).
7. J. C. Pickel and J. T. Blandford, Jr., “Single Event Upset Modeling for Static MOS Memory Cells”, DNA-TR-81-259 (1984).
8. M. S. Mock, “Time Dependent Simulation of Integrated Circuits”, in Proc. 3rd Int. Conf. Numerical Analysis of Semicond. Devices Integr. Circuits, 1911 (1983).
9. F. B. McClean and T. R. Oldham, “Charge Funneling in N- and P-Type Si Substrates”, IEEE Trans. Nuc. Sci. NS-29, 2018 (1982).
10. G. C. Messenger, “Collection of Charge on Junction Nodes from Ion Tracks”, IEEE Trans. Nuc. Sci. NS-29, 2024 (1982).