Detection and diagnosis of oscillations in process plants

Lecture Notes in Artificial Intelligence (Subseries of Lecture Notes in Computer Science)

Volumn 2773 PART 1, Issue , 2003, Pages 1258-1264

  Matsuo, Toru ^a   Sasaoka, Hideki ^b   Yamashita, Yoshiyuki ^c  

^a MITSUI CHEMICALS INC   (Japan)

^b YAMATAKE CORPORATION   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL PLANTS; COMPUTER HARDWARE; COMPUTER SOFTWARE; INDUSTRIAL CHEMICALS; INFORMATION THEORY; QUALITY CONTROL; WAVELET TRANSFORMS; CHEMICAL DETECTION; INDUSTRIAL PLANTS; KNOWLEDGE BASED SYSTEMS; WAVELET ANALYSIS;

OSCILLATION DETECTION; WAVELET ANALYSIS TOOLS; DETECTION AND DIAGNOSIS; IN-PROCESS; INPUT-OUTPUT CHARACTERISTICS; OSCILLATORY CONTROL; PRACTICAL METHOD; ROOT CAUSE;

PLANT MANAGEMENT; CHEMICAL ANALYSIS;

EID: 8344280805     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-45224-9_170     Document Type: Conference Paper

References (3)

1. Horsh,A., Condition Monitoring of Control Loops, PhD Thesis, Royal Institute of Technology, Stockholm, Sweden (2000).
2. Thornhill,N. F., Shah.S.L. and Huang,B., Detection of Distributed Oscillations and Root-Cause Diagnosis, CHEMFAS4, Korea, June (2001) 167-172.
3. Matsuo,T. and Sasaoka,H., Application of Wavelet analysis to chemical process diagnosis," KES'2002, Crema, Italy (2002) 843-847.