Electron backscatter diffraction as a useful method for alloys microstructure characterization

Journal of Alloys and Compounds

Volumn 382, Issue 1-2, 2004, Pages 17-23

  Klimek, Leszek ^a   Pietrzyk, Bozena ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Electron backscatter diffraction; Energy dispersive spectroscopy; Metals; Scanning electron microscopy

Indexed keywords

BACKSCATTERING; CRYSTAL LATTICES; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; METAL CASTING; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SOLID SOLUTIONS;

CO-CR-MO ALLOY; ELECTRON BACKSCATTER DIFFRACTION (EBSD); METAL IMPLANTS;

COBALT ALLOYS;

EID: 8344269353     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.06.012     Document Type: Conference Paper

References (12)

1. P. Kula, Inżynieria Warstwy Wierzchniej (Surface layer engineering), Wydawnictwo Politechniki Łódzkiej, Łódź, 2000 (in Polish).
2. P.F. Kane, G.B. Larrabee, Characterization of Solid Surfaces, Plenum Press, New York, 1978.
3. H.P. Klug., L.E Alexander, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, Wiley, New York, 1974.
4. Dingley D.J., Randle V. J. Mater. Sci. 27:1992;4545-4566.
5. A.J. Schwartz, M. Kumar, B.L. Adams, Electron Backscatter Diffraction in Materials, Science, Kluwer Academic Publishers/Plenum Press, New York/Dordrecht, 2000.
6. Klimek L. Inżynieria Materiałowa. 5:2002;658-661. (in Polish).
7. Zhu Y.H., Lee W.B. Mater. Charact. 46:2001;19-23.
8. Cheung Y.L., Chan K.C., Zhu Y.H. Mater. Charact. 47:2001;299-305.
9. Paransky Y., Gotman I., Gutmanas E.Y. Mater. Sci. Eng. A. 277:2000;83-94.
10. J. Ryœ, Stereologia materiałów (Stereology of materials), Fotobit Design, Kraków, 1995 (in Polish).
11. R.T. DeHoff, F.N. Rhines, Quantitative Microscopy, McGraw-Hill, New York, 1968.
12. Paszenda Z., Marciniak J. Mater. Process. Technol. 78:1998;143-149.