Examination of the atomic pair distribution function (PDF) of SiC nanocrystals by in-situ high pressure diffraction

Journal of Alloys and Compounds

Volumn 382, Issue 1-2, 2004, Pages 133-137

  Grzanka, E ^a,b   Stel'makh, S ^a   Gierlotka, S ^a   Zhao, Y ^c   Palosz, B ^a   Palosz, W ^d  

^a INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

^b UNIVERSITY OF WARSAW   (Poland)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d NASA MARSHALL SPACE FLIGHT CENTER   (United States)

Author keywords

Diffraction; High pressure; Nanocrystals; Silicon carbide

Indexed keywords

CORRELATION METHODS; ELASTIC MODULI; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; NEUTRON DIFFRACTION; PRESSURE EFFECTS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

DIFFRACTION PATTERN; HIGH PRESSURE; NANOCRYSTALS; PAIR DISTRIBUTION FUNCTION (PDF);

SILICON CARBIDE;

EID: 8344268548     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.04.142     Document Type: Conference Paper

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