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Volumn 6, Issue 18, 2004, Pages 4432-4439

Depletion interaction measured by colloidal probe atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

EID: 8344252768     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b404030a     Document Type: Article
Times cited : (18)

References (41)
  • 14
    • 8344220656 scopus 로고    scopus 로고
    • PhD Thesis, Wageningen University
    • M. Giesbers, PhD Thesis, Wageningen University, 2001.
    • (2001)
    • Giesbers, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.