메뉴 건너뛰기




Volumn 60, Issue 10, 2004, Pages

4-Nitroanilinium nitrate

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CHARGE COUPLED DEVICES; COMPUTATIONAL GEOMETRY; CRYSTAL STRUCTURE; ELECTRONS; HYDROGEN BONDS; NEGATIVE IONS; POSITIVE IONS; SINGLE CRYSTALS; X RAY DIFFRACTION; X RAYS;

EID: 8344234180     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270104021122     Document Type: Article
Times cited : (8)

References (11)
  • 8
    • 8344276109 scopus 로고    scopus 로고
    • Kuma Diffraction, Wroclław, Poland
    • Kuma (2001). KM-4 Software. Kuma Diffraction, Wroclław, Poland.
    • (2001) KM-4 Software
  • 9
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1990). SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1990) SHELXTL
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.