-
1
-
-
0024944875
-
Measurement of surface roughness by a machine vision system
-
J F. Luk, V. Hyunh, W. North, Measurement of surface roughness by a machine vision system, Journal of Physics E, Scientific Instruments 22 (1989) 977-980.
-
(1989)
Journal of Physics E, Scientific Instruments
, vol.22
, pp. 977-980
-
-
Luk, J.F.1
Hyunh, V.2
North, W.3
-
3
-
-
0033101071
-
Surface roughness classification for castings
-
D.-M. Tsai, C.-F. Tseng, Surface roughness classification for castings, Pattern Recognition 32 (1999) 389-405.
-
(1999)
Pattern Recognition
, vol.32
, pp. 389-405
-
-
Tsai, D.-M.1
Tseng, C.-F.2
-
4
-
-
8344237088
-
High-speed surface roughness measurement
-
D.G. Jason, J.M. Rourke, A.C. Bell, High-speed surface roughness measurement, Transactions of ASME 34 (106) (1984) 34-39.
-
(1984)
Transactions of ASME
, vol.34
, Issue.106
, pp. 34-39
-
-
Jason, D.G.1
Rourke, J.M.2
Bell, A.C.3
-
6
-
-
0019933002
-
Surface roughness measurement by scanning electron microscope
-
H. Sato, M.O. Hori, Surface roughness measurement by scanning electron microscope, Annals of CIRP 31 (1982) 457-462.
-
(1982)
Annals of CIRP
, vol.31
, pp. 457-462
-
-
Sato, H.1
Hori, M.O.2
-
7
-
-
0030709942
-
Non contact surface roughness measurement of engineering surface by total integrated infrared scattering
-
M. Bjuggren, L. Krummenacher, L. Mattsson, Non contact surface roughness measurement of engineering surface by total integrated infrared scattering, Precision Engineering 20 (1997) 33-45.
-
(1997)
Precision Engineering
, vol.20
, pp. 33-45
-
-
Bjuggren, M.1
Krummenacher, L.2
Mattsson, L.3
-
8
-
-
0029757079
-
A new approach to modeling machined surface profiles
-
M. Hasewaga, K. Okuda, J.C. Liu, M. Nunobiki, A new approach to modeling machined surface profiles, Proceedings: Institute of Mechanical Engineering 240 (1996) 177-182.
-
(1996)
Proceedings: Institute of Mechanical Engineering
, vol.240
, pp. 177-182
-
-
Hasewaga, M.1
Okuda, K.2
Liu, J.C.3
Nunobiki, M.4
-
9
-
-
0029230137
-
Roughness parameters of surfaces by atomic force microscopy
-
K. Carneiro, C.P. Jensen, J.F. Jorgensen, J. Garnoes, Roughness parameters of surfaces by atomic force microscopy, Annals of CIRP 44 (1995) 517-522.
-
(1995)
Annals of CIRP
, vol.44
, pp. 517-522
-
-
Carneiro, K.1
Jensen, C.P.2
Jorgensen, J.F.3
Garnoes, J.4
-
12
-
-
0031274716
-
3D tool wear measurement and visualization using stereo imaging
-
A. Kartik, S. Chandra, B. Ramamoorthy, S. Das, 3D tool wear measurement and visualization using stereo imaging, International Journal for Machine Tools and Manufacture 37 (1997) 1573-1581.
-
(1997)
International Journal for Machine Tools and Manufacture
, vol.37
, pp. 1573-1581
-
-
Kartik, A.1
Chandra, S.2
Ramamoorthy, B.3
Das, S.4
-
13
-
-
0019654284
-
Cubic convolution interpolation for digital image processing
-
R.G. Keys, Cubic convolution interpolation for digital image processing, IEEE Transactions of ASSP 29 (6) (1981) 1153-1160.
-
(1981)
IEEE Transactions of ASSP
, vol.29
, Issue.6
, pp. 1153-1160
-
-
Keys, R.G.1
-
14
-
-
8344279160
-
-
School of Electrical and Computer Engineering, Purdue University, West Lajayette, IN 47907-1285, workdone at Hewlett Packett, CA
-
J. Allebach, P.W. Wong, Edge-directed interpolation, School of Electrical and Computer Engineering, Purdue University, West Lajayette, IN 47907-1285, workdone at Hewlett Packett, CA.
-
Edge-directed Interpolation
-
-
Allebach, J.1
Wong, P.W.2
-
15
-
-
0030421702
-
Edge-directed interpolation
-
IEEE Press, Lausnne, CH
-
J. Allebach, P.W. Wong, Edge-directed interpolation, Proceedings of the ICIP-96, vol. III, IEEE Press, Lausnne, CH, 1996, pp. 707-710.
-
(1996)
Proceedings of the ICIP-96
, vol.3
, pp. 707-710
-
-
Allebach, J.1
Wong, P.W.2
-
18
-
-
0025414841
-
Role of fractal geometry in roughness characterization and contact mechanics of surfaces
-
A. Majumdar, B. Bhushan, Role of fractal geometry in roughness characterization and contact mechanics of surfaces, ASME Journal of Tribology 112 (1990) 205-216.
-
(1990)
ASME Journal of Tribology
, vol.112
, pp. 205-216
-
-
Majumdar, A.1
Bhushan, B.2
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