Dislocation dynamics simulations of the Bauschinger effect in metallic thin films

Computational Materials Science

Volumn 54, Issue 1, 2012, Pages 350-355

  Zhou, Caizhi ^a   Lesar, Richard ^b,c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b Iowa State University of Science and Technology   (United States)

^c IOWA STATE UNIVERSITY   (United States)

Author keywords

Bauschinger effect; Dislocation dynamics; Grain boundaries; Passivation layer; Thin films

Indexed keywords

BAUSCHINGER EFFECTS; DEFORMATION BEHAVIOR; DISLOCATION DYNAMICS; DISLOCATION DYNAMICS SIMULATION; FREESTANDING FILMS; METALLIC THIN FILMS; PASSIVATED FILM; PASSIVATION LAYER; PILE-UPS; PRE-STRAIN; RATE INCREASE; SURFACE PASSIVATION;

ASPECT RATIO; DYNAMICS; GEOMETRY; GRAIN BOUNDARIES; HARDENING; PASSIVATION; PILES; THIN FILMS; UNLOADING;

STRENGTH OF MATERIALS;

EID: 83255165396     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2011.09.031     Document Type: Article

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