TEM analysis of high temperature annealed W nanostructure surfaces

Journal of Nuclear Materials

Volumn 421, Issue 1-3, 2012, Pages 22-27

  Kajita, Shin ^a   Yoshida, Naoaki ^b   Yoshihara, Reiko ^b   Ohno, Noriyasu ^a   Yokochi, Takanori ^a   Tokitani, Masayuki ^c   Takamura, Shuichi ^d  

^a NAGOYA UNIVERSITY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE FOR FUSION SCIENCE   (Japan)

^d AICHI INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HEATING; FOCUSED ION BEAM TECHNIQUE; HELIUM PLASMAS; HIGH TEMPERATURE; NAGDIS-II; NANO-STRUCTURED; NANOSTRUCTURE SURFACE; TEM ANALYSIS; TEM IMAGES; TRANSMISSION ELECTRON MICROSCOPE;

HELIUM; IRRADIATION; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN;

NANOSTRUCTURES;

EID: 83155163875     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2011.11.044     Document Type: Article

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