Surface plasmon leakage radiation microscopy at the diffraction limit

Optics Express

Volumn 19, Issue 25, 2011, Pages 25749-25762

  Hohenau, A ^a   Krenn, J R ^a   Drezet, A ^b   Mollet, O ^b   Huant, S ^b   Genet, C ^c   Stein, B ^c   Ebbesen, T W ^c  

^a UNIVERSITY OF GRAZ   (Austria)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC WAVE POLARIZATION; PARTICLE OPTICS; PHONONS; PHOTONS; QUANTUM THEORY; SURFACE PLASMON RESONANCE;

DIFFRACTION LIMITED SPATIAL RESOLUTION; DIFFRACTION LIMITS; FRINGE PATTERN; IMAGE FORMATION PROCESS; LEAKAGE RADIATION MICROSCOPIES; SURFACE PLASMON POLARITONS; SURFACE PLASMONS;

PLASMONS;

ARTICLE; COMPARATIVE STUDY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; LIGHT; MICROSCOPY; RADIATION DOSE; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PLASMON RESONANCE; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; LIGHT; MICROSCOPY; MODELS, THEORETICAL; RADIATION DOSAGE; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PLASMON RESONANCE;

EID: 82955208276     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.025749     Document Type: Article

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