Effect of yttria content on the zirconia unit cell parameters

Journal of the American Ceramic Society

Volumn 94, Issue 12, 2011, Pages 4548-4555

  Krogstad, Jessica A ^a   Lepple, Maren ^a   Gao, Yan ^b   Lipkin, Don M ^b   Levi, Carlos G ^a  

^a University of California   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CUBIC PHASIS; HIGH RESOLUTION X RAY DIFFRACTION; PHASE ANALYSIS; POTENTIAL SOURCES; RIETVELD REFINEMENT METHOD; STABILIZATION MECHANISMS; STABILIZED ZIRCONIA; TRANSITION REGIONS; UNIT CELL PARAMETERS; WHOLE-PATTERN FITTING; YTTRIA CONTENT;

LATTICE CONSTANTS; RIETVELD REFINEMENT; THERMAL BARRIER COATINGS; X RAY DIFFRACTION; YTTRIA STABILIZED ZIRCONIA; YTTRIUM ALLOYS;

ZIRCONIA;

EID: 82955207170     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2011.04862.x     Document Type: Article

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