Phase transition sequence in sodium bismuth titanate observed using high-resolution x-ray diffraction

Applied Physics Letters

Volumn 99, Issue 22, 2011, Pages

  Aksel, Elena ^a   Forrester, Jennifer S ^a   Kowalski, Benjamin ^a   Jones, Jacob L ^a   Thomas, Pam A ^b  

^a University of Florida   (United States)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOLING; DISCRETE PHASE; FERROELECTRIC ORDER; HIGH RESOLUTION; HIGH RESOLUTION X RAY DIFFRACTION; NANO SCALE; POWDER X RAY DIFFRACTION; SODIUM BISMUTH TITANATE; SPACE GROUPS; STRUCTURAL CHANGE; STRUCTURAL TRANSITIONS; TIO; TRANSITION SEQUENCES;

BISMUTH; PHASE TRANSITIONS; SINGLE CRYSTALS; SODIUM; SOLVENTS; X RAY DIFFRACTION;

FERROELECTRIC MATERIALS;

EID: 82955194706     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3664393     Document Type: Article

References (17)

1. G. A. Smolenskii, V. A. Isupov, A. I. Agranovskaya, and N. N. Krainik, Sov. Phys. Solid State 2, 2651 (1961).
2. J. Roedel, W. Jo, K. T. P. Seifert, E.-M. Anton, T. Granzow, and D. Damjanovic, J. Am. Ceram. Soc. 92, 1153 (2009).
3. J. A. Zvirgzds, P. P. Kapostins, J. V. Zvirgzde, and T. V. Kruzina, Ferroelectrics 40, 75 (1982). 10.1080/00150198208210600
4. S. B. Vakhrushev, V. A. Isupov, B. E. Kvyatkovsky, N. M. Okuneva, I. P. Pronin, G. A. Smolensky and P. P. Syrnikov, Ferroelectrics 63, 153 (1985). 10.1080/00150198508221396
5. J. Suchanicz and J. Kwapulinski, Ferroelectrics 165, 249 (1995). 10.1080/00150199508228304
6. G. O. Jones and P. A. Thomas, Acta. Crystallogr. B 56, 426 (2000). 10.1107/S0108768100001166
7. G. O. Jones and P. A. Thomas, Acta. Crystallogr. B 58, 168 (2002). 10.1107/S0108768101020845 (Pubitemid 135686816)
8. Y. Hiruma, H. Nagata, and T. Takenaka, J. Appl. Phys. 105, 084112 (2009). 10.1063/1.3115409
9. V. Dorcet and G. Trolliard, Acta Mater. 56, 1753 (2008). 10.1016/j.actamat.2007.12.027
10. V. Dorcet, G. Trolliard, and P. Boullay, Chem. Mater. 20, 5061 (2008). 10.1021/cm8004634
11. R. Beanland and P. A. Thomas, Scr. Mater. 65, 440 (2011). 10.1016/j.scriptamat.2011.05.031
12. S. Gorfman and P. A. Thomas, J. Appl. Crystallogr. 43, 1409 (2010). 10.1107/S002188981003342X
13. E. Aksel, J. S. Forrester, J. L. Jones, P. A. Thomas, K. Page, and M. R. Suchomel, Appl. Phys. Lett. 98, 152901 (2011). 10.1063/1.3573826
14. A. C. Larson and R. B. Von Dreele, General structure analysis system (GSAS)., Los Alamos National Laboratory Report LAUR 86-748, 2004.
15. J. Rodrguez-Carvajal, M. Hennion, F. Moussa, A. H. Moudden, L. Pinsard, and A. Revcolevschi, Phys. Rev. B 57, R3189 (1998).
16. See supplementary material at http://dx.doi.org/10.1063/1.3664393 E-APPLAB-99-092148 for refinement outputs and quality of fit indicators in Tables SI.
17. M. Davies, E. Aksel, and J. L. Jones, J. Am. Ceram. Soc. 94, 1314 (2011). 10.1111/j.1551-2916.2011.04441.x