Relaxor characteristics of morphotropic phase boundary (Bi 1/2Na1/2)TiO3-(Bi1/2K 1/2)TiO3 modified with Bi(Zn1/2Ti 1/2)O3

Journal of the American Ceramic Society

Volumn 94, Issue 12, 2011, Pages 4283-4290

  Dittmer, Robert ^a   Jo, Wook ^a   Daniels, John ^b   Schaab, Silke ^a   Rödel, Jürgen ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; DIELECTRIC PERMITTIVITIES; ELECTRIC-FIELD-INDUCED STRAIN; FERROELECTRIC PHASE; IN-SITU; MORPHOTROPIC PHASE BOUNDARIES; PIEZOELECTRIC COEFFICIENT; RELATIVE PERMITTIVITY; RELAXOR CHARACTERISTICS; STRUCTURAL CHANGE; TEMPERATURE DEPENDENT; THRESHOLD FIELDS; TIO;

CRYSTAL MICROSTRUCTURE; ELECTRIC FIELDS; PERMITTIVITY; POLARIZATION; SODIUM; ZINC;

PIEZOELECTRICITY;

EID: 82955189199     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2011.04631.x     Document Type: Article

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