Effect of composition on the growth and microstructure of hafnia-zirconia based coatings

Surface and Coatings Technology

Volumn 206, Issue 7, 2011, Pages 1628-1633

  Noor A Alam, M ^a   Choudhuri, A R ^a   Ramana, C V ^a  

^a 500 W University Avenue   (United States)

Author keywords

Composition; Microstructure; Scanning electron microscopy; Thermal barrier coating; X ray diffraction; Yttria stabilized hafnia zirconia

Indexed keywords

COLUMNAR GROWTH; CRYSTAL STRUCTURE ANALYSIS; CRYSTAL STRUCTURE AND MORPHOLOGY; DENSE STRUCTURES; ENHANCED STABILITY; HIGH-TEMPERATURE XRD; SCANNING ELECTRONS; THERMAL BARRIER; YTTRIA-STABILIZED HAFNIA-ZIRCONIA;

CHEMICAL ANALYSIS; COATINGS; HAFNIUM OXIDES; MICROSTRUCTURE; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; THERMAL BARRIER COATINGS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; YTTRIA STABILIZED ZIRCONIA; YTTRIUM ALLOYS; ZIRCONIA; ZIRCONIUM ALLOYS;

CRYSTAL STRUCTURE;

EID: 82755197897     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2011.06.040     Document Type: Article

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