Building materials effects of al content and physical properties on the electromagnetic interference shielding of sn based coating thin layers

Applied Mechanics and Materials

Volumn 142, Issue 3, 2012, Pages 142-151

  Hung, Fei Shuo ^a   Hung, Fei Yi ^a   Chiang, Che Ming ^a   Lui, Truan Sheng ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Coating; Electromagnetic interference (EMI); Sn Al; Sputtering

Indexed keywords

AL CONTENT; ANNEALED TREATMENT; CLOSED STRUCTURES; COATING LAYER; COATING SPECIMENS; COATING THICKNESS; ELECTROMAGNETIC INTERFERENCE (EMI); ELECTROMAGNETIC INTERFERENCE SHIELDING; EMI SHIELD; EMI SHIELDING; HIGH FREQUENCY; HIGHER FREQUENCIES; LOW FREQUENCY; LOWER FREQUENCIES; SMALL PARTICLE SIZE; SN-AL; THIN LAYERS;

ALUMINUM; BUILDING MATERIALS; COATINGS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROMAGNETISM; INTELLIGENT MATERIALS; POWDER COATINGS; POWDERS; SHIELDING; SIGNAL INTERFERENCE; SPUTTERING; THICKNESS MEASUREMENT; TIN;

ELECTROMAGNETIC SHIELDING;

EID: 82655185603     PISSN: 16609336     EISSN: 16627482     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMM.142.142     Document Type: Conference Paper

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