A model based approach to intensity normalization for terrestrial laser scanners

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8286, Issue , 2011, Pages

  Errington, Angus F C ^a   Daku, Brian L F ^a   Prugger, Arnfinn F ^b  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b Potash Corporation of Saskatchewan   (Canada)

Author keywords

Intensity; LIDAR; Measurement; Modelling; TLS

Indexed keywords

ANGLE OF INCIDENCE; INTENSITY; INTENSITY VALUES; INTERNAL PARAMETERS; LASER SCANNER; MEASURE DISTANCE; MODEL BASED APPROACH; MODEL PARAMETERS; MODELLING; OBJECT REFLECTANCE; REFLECTANCE PROPERTIES; REFLECTANCE VALUES; REFLECTED LIGHT; REGISTRATION ALGORITHMS; SIMILAR MODELS; SURROUNDING ENVIRONMENT; TERRESTRIAL LASER SCANNERS; TIME-CONSUMING TASKS; TLS;

ALGORITHMS; LASER APPLICATIONS; MEASUREMENTS; OPTICAL RADAR; REFLECTION; SCANNING; SEEBECK EFFECT;

SURVEYING INSTRUMENTS;

EID: 82655172782     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.912591     Document Type: Conference Paper

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