Raman scattering from biased molecular conduction junctions: The electronic background and its temperature

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 19, 2011, Pages

  Galperin, Michael ^a   Nitzan, Abraham ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 82655168206     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.195325     Document Type: Article

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