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Volumn 4, Issue 12, 2011, Pages 4972-4977

Resistive and thermal scale effects for Cu(In, Ga)Se2 polycrystalline thin film microcells under concentration

(8) Paire, Myriam a,b,c,d Shams, Artabaze a,b,c Lombez, Laurent a,b,c Péré Laperne, Nicolas b Collin, Stéphane b Pelouard, Jean Luc b Guillemoles, Jean Franois a,b,c Lincot, Daniel a,b,c

a EDF R AND D (France)

b CNRS (France)

c PSL RESEARCH UNIVERSITY (France)

d SORBONNE UNIVERSITÉ (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE AREA; CELL PERFORMANCE; CELL SIZE; CONCENTRATOR CELLS; CU(IN , GA)SE; EFFICIENCY INCREASE; GLASS SUBSTRATES; HIGH CONCENTRATION; HIGH FLUX; HIGH INJECTION; LOW CONCENTRATIONS; MATERIAL CONSUMPTION; MICRO CELL; POLYCRYSTALLINE THIN FILM; RESISTIVE LOSS; SCALE EFFECTS; SPREADING RESISTANCE; SURFACE-TO-VOLUME RATIO; TEMPERATURE INCREASE; THIN-FILM TECHNOLOGY; WINDOW LAYER;

CONVERSION EFFICIENCY; GALLIUM; NANOSTRUCTURED MATERIALS; SEMICONDUCTING SELENIUM COMPOUNDS; SUBSTRATES; THIN FILMS;

COPPER;

COPPER; ELECTRICAL RESISTIVITY; ENERGY EFFICIENCY; FILM; FUEL CELL; HIGH TEMPERATURE; SELENIUM; SOLAR POWER;

EID: 82555193630 PISSN: 17545692 EISSN: 17545706 Source Type: Journal
DOI: 10.1039/c1ee01661j Document Type: Article

Times cited : (43)

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