A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields

Review of Scientific Instruments

Volumn 82, Issue 11, 2011, Pages

  White, S C ^a   Singh, U R ^a   Wahl, P ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; SAPPHIRE; THERMAL CONDUCTIVITY;

HIGH MAGNETIC FIELDS; LOW TEMPERATURES; MECHANICAL STIFFNESS; SPECTROSCOPIC IMAGING; TOPOGRAPHIC IMAGING; TUNNELING SPECTROSCOPY; VIBRATIONAL MODES;

SCANNING TUNNELING MICROSCOPY;

EID: 82555182692     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3663611     Document Type: Article

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