SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 82, Issue 11, 2011, Pages

Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties

(6) Liao, H S a,b Juang, B J a,b Chang, W C b Lai, W C b Huang, K Y a Chang, C S b

a NATIONAL TAIWAN UNIVERSITY (Taiwan)

b INSTITUTE OF PHYSICS (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR POSITIONING; ANGULAR RESOLUTION; ANISOTROPIC FRICTION; ANISOTROPIC SURFACES; ATOMIC CONFIGURATION; ATOMIC FORCE MICROSCOPES; ATOMIC-SCALE STICK-SLIP; CANTILEVER TIP; CLOSE LOOP; DRIVING METHOD; OPTICAL MICROSCOPES; POSITIONING SYSTEM; VISUAL MEASUREMENTS;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; MICROSCOPES; NAVIGATION SYSTEMS; SLIP FORMING;

SURFACE PROPERTIES;

EID: 82555173680 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3664617 Document Type: Article

Times cited : (7)

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