Note: Curve fit models for atomic force microscopy cantilever calibration in water

Review of Scientific Instruments

Volumn 82, Issue 11, 2011, Pages

  Kennedy, Scott J ^a   Cole, Daniel G ^b   Clark, Robert L ^c  

^a USA   (United States)

^b PA 15260   (United States)

^c University of Rochester   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY CANTILEVERS; COMMERCIAL INSTRUMENTS; CURVE-FIT; HARMONIC OSCILLATOR MODEL;

ATOMIC FORCE MICROSCOPY; CALIBRATION; NANOCANTILEVERS; OSCILLATORS (MECHANICAL); WHITE NOISE;

CURVE FITTING;

WATER;

AIR; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; STANDARD;

AIR; CALIBRATION; MICROSCOPY, ATOMIC FORCE; WATER;

EID: 82555164542     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3661130     Document Type: Article

References (5)

1. L. J. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993). 10.1063/1.1143970
2. T. Pirzer and T. Hugel, Rev. Sci. Instrum. 80, 035110 (2009). 10.1063/1.3100258
3. J. E. Sader, J. Appl. Phys. 84, 64 (1998). 10.1063/1.368002
4. D. G. Cole and R. L. Clark, J. Appl. Phys. 101, 034303 1 (2007). 10.1063/1.2429726 (Pubitemid 46280910)
5. S. J. Kennedy, D. G. Cole, and R. L. Clark, Rev. Sci. Instrum. 80, 125103 (2009). 10.1063/1.3263907