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Volumn 107, Issue 23, 2011, Pages

Tracer measurements of atomic diffusion inside shear bands of a bulk metallic glass

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DIFFUSIONS; BULK METALLIC GLASS; DIFFUSION RATE; FREE VOLUME DISTRIBUTION; MATRIX; ORDERS OF MAGNITUDE; RADIOTRACER TECHNIQUES; SHORT-CIRCUIT DIFFUSION; TRACER MEASUREMENT;

EID: 82455220440     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.107.235503     Document Type: Article
Times cited : (117)

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