Minimizing tip-sample contact force in automated atomic force microscope based force spectroscopy

Proceedings of the ASME Design Engineering Technical Conference

Volumn 6, Issue , 2009, Pages 731-736

  Rivera, Monica ^a   Morris, Carleen ^b   Carlson, David ^b   Toone, Eric J ^b   Cole, Daniel G ^c   Clark, Robert L ^d  

^a University of Rochester   (United States)

^b DUKE UNIVERSITY   (United States)

^c University of Pittsburgh   (United States)

^d UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONTACT FORCES; FEEDBACK PROCESS; FORCE FEEDBACK; FORCE SPECTROSCOPY; SAMPLE SURFACE; SENSOR DRIFT; SYSTEM DRIFT; TIP-SAMPLE CONTACT;

ATOMIC FORCE MICROSCOPY; DESIGN; NANOSYSTEMS; SURFACE TOPOGRAPHY;

ATOMIC SPECTROSCOPY;

EID: 82155183324     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC2009-87378     Document Type: Conference Paper

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