Guest editorial cyber, physical, and system security for smart grid

IEEE Transactions on Smart Grid

Volumn 2, Issue 4, 2011, Pages 643-644

  Ren, Kui ^a   Li, Zuyi ^a   Qiu, Robert Caiming ^b  

^a Illinois Institute of Technology   (United States)

^b Tennessee Technological University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 82155175603     PISSN: 19493053     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSG.2011.2175834     Document Type: Editorial

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