Quantitative two-layer conductivity inversion of multi-configuration electromagnetic induction measurements

Vadose Zone Journal

Volumn 10, Issue 4, 2011, Pages 1319-1330

  Mester, Achim ^a   van Der Kruk, Jan ^a   Zimmermann, Egon ^a   Vereecken, Harry ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Electrical resistivity tomography; Electromagnetic; Electromagnetic induction; EM; EMI; ERT; HCP; Horizontal coplanar; Local sensitivity; LS; Perpendicular; PRP; VCP; Vertical coplanar

Indexed keywords

ELECTRICAL RESISTIVITY TOMOGRAPHY; ELECTROMAGNETIC; EM; EMI; ERT; HCP; HORIZONTAL COPLANAR; LOCAL SENSITIVITY; LS; PERPENDICULAR; PRP; VCP; VERTICAL COPLANAR;

ELECTROMAGNETIC INDUCTION; MAGNETIC FIELDS;

ELECTRIC CONDUCTIVITY;

CALIBRATION; DATA SET; ELECTRICAL CONDUCTIVITY; ELECTRICAL RESISTIVITY; ELECTROMAGNETIC FIELD; EXPERIMENTAL STUDY; MAGNETIC FIELD; MAPPING; QUANTITATIVE ANALYSIS; SMOOTHING; TOMOGRAPHY;

EID: 82055171695     PISSN: None     EISSN: 15391663     Source Type: Journal    
DOI: 10.2136/vzj2011.0035     Document Type: Article

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