Characterization of the surface plasmon polariton band gap in an Ag/SiO2/Ag T-shaped periodical structure

Optics Express

Volumn 19, Issue 24, 2011, Pages 23698-23705

  Cheng, Cheng Wen ^a,b,c   Abbas, Mohammed Nadhim ^b,c,d   Shih, Min Hsiung ^b   Chang, Yia Chung ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^c ACADEMIA SINICA   (Taiwan)

^d NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; ENERGY GAP; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; SILVER;

ABSORBANCE SPECTRUM; ANGLE DEPENDENCE; INCIDENT ANGLES; INFRARED WAVELENGTHS; LOCALIZED SURFACE PLASMON; PERIODICAL STRUCTURE; STRUCTURAL GEOMETRY; SURFACE PLASMON POLARITONS;

SURFACE PLASMON RESONANCE;

SILICON DIOXIDE; SILVER;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; INFRARED RADIATION; LIGHT; MATERIALS TESTING; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PLASMON RESONANCE;

CRYSTALLIZATION; INFRARED RAYS; LIGHT; MATERIALS TESTING; REFRACTOMETRY; SCATTERING, RADIATION; SILICON DIOXIDE; SILVER; SURFACE PLASMON RESONANCE;

EID: 82055170180     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.023698     Document Type: Article

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