Effects of surface tension and axis stress on piezoelectric behaviors of ferroelectric nanowires

Applied Physics Letters

Volumn 99, Issue 20, 2011, Pages

  Chen, Y Q ^a   En, Y F ^a   Huang, Y ^a   Kong, X D ^a   Zheng, X J ^b   Lu, Y D ^a  

^a No5 Electronics Research Institute   (China)

^b BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AXIS STRESS; COERCIVE FIELD; FERROELECTRIC NANOSTRUCTURES; GINZBURG LANDAU THEORY; PIEZOELECTRIC BEHAVIOR; STRAIN ENGINEERING; TIME-DEPENDENT;

COERCIVE FORCE; COMPRESSIVE STRESS; CRYSTALLOGRAPHY; FERROELECTRICITY; NANOWIRES; PIEZOELECTRICITY; PILE FOUNDATIONS; POLARIZATION; TENSILE STRESS;

SURFACE TENSION;

EID: 81855198018     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3661169     Document Type: Article

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