Reassessment of 182Hf AMS measurements at VERA

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 269, Issue 24, 2011, Pages 3180-3182

  Forstner, O ^a   Gnaser, H ^b   Golser, R ^a   Hanstorp, D ^c   Martschini, M ^a   Priller, A ^a   Rohlen J ^c   Steier, P ^a   Vockenhuber, C ^d   Wallner, A ^a  

^a UNIVERSITY OF VIENNA   (Austria)

^b Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^c UNIVERSITY OF GOTHENBURG   (Sweden)

^d ETH ZURICH   (Switzerland)

Author keywords

182Hf; AMS; Negative ion yield; Sputter ion source

Indexed keywords

AMS; ASTROPHYSICAL APPLICATIONS; DETECTION LIMITS; EARLY SOLAR SYSTEMS; FLUORIDE ION; SUPERNOVA REMNANTS; TARGET MATRICES; TARGET POSITION; TARGET SURFACE; THEORETICAL CALCULATIONS;

CESIUM; EARTH (PLANET); ELECTRON AFFINITY; HAFNIUM; ION SOURCES; TUNGSTEN;

CESIUM COMPOUNDS;

EID: 81855185575     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2011.04.022     Document Type: Conference Paper

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