Dealloying of platinum-aluminum thin Films: Dynamics of pattern formation

Physical Review Letters

Volumn 107, Issue 22, 2011, Pages

  Galinski, Henning ^a   Ryll, Thomas ^a   Schlagenhauf, Lukas ^a   Rechberger, Felix ^a   Ying, Sun ^a   Gauckler, Ludwig J ^a   Mornaghini, Flavio C F ^a   Ries, Yasmina ^a   Spolenak, Ralph ^a   Döbeli, Max ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DEALLOYING; DISSOLUTION PROCESS; IN-DEPTH ANALYSIS; NANOPOROSITY; NANOTOMOGRAPHY; PATTERN FORMATION; PHYSICAL MECHANISM; POROSITY FORMATION; RATE LAWS; REACTION DIFFUSION SYSTEMS;

ALUMINUM; DIFFUSION; DISSOLUTION; OPTICAL FILMS; PATTERN MATCHING; PLATINUM; POROSITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

THIN FILMS;

EID: 81855167633     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.107.225503     Document Type: Article

References (23)

1. M. Raney, US Patent No. 1628190 1927.
2. J. Erlebacher, M.J. Aziz, A. Karma, N. Dimitrov, and K. Sieradzki, Nature (London) NATUAS 0028-0836 410, 450 (2001). 10.1038/35068529 (Pubitemid 32240040)
3. J. Erlebacher, in Dekker Encyclopedia of Nanoscience and Nanotechnology, edited by, J.A. Schwarz, C.I. Contescu, K. Putyera, (Marcel Dekker Inc., New York, 2004), p. 893.
4. J. Erlebacher, J. Electrochem. Soc. 151, C614 (2004). JESOAN 0013-4651 10.1149/1.1784820
5. R. Yang, P. Strasser, and M.F. Toney, J. Phys. Chem. C 115, 9074 (2011) 10.1021/jp111978m. 1932-7447
6. C. Eilks and C. Elliott, J. Comput. Phys. 227, 9727 (2008). JCTPAH 0021-9991 10.1016/j.jcp.2008.07.023
7. A.J. Forty, Nature (London) NATUAS 0028-0836 282, 597 (1979). 10.1038/282597a0
8. M.C. Simmonds, H. Kheyrandish, J.S. Colligon, M.L. Hitchman, N. Cade, and J. Iredale, Corrosion Science CRRSAA 0010-938X 40, 43 (1998). 10.1016/S0010-938X(97)00109-1
9. J.C. Thorp, K. Sieradzki, L. Tang, P.A. Crozier, A. Misra, M. Nastasi, D. Mitlin, and S.T. Picraux, Appl. Phys. Lett. 88, 033110 (2006). APPLAB 0003-6951 10.1063/1.2161939 (Pubitemid 43133716)
10. R.D. Benguria and M.C. Depassier, Phys. Rev. Lett. 77, 1171 (1996). PRLTAO 0031-9007 10.1103/PhysRevLett.77.1171
11. R. Fisher, Ann. Eugenics 7, 355 (1937). 1469-1809 10.1111/j.1469-1809. 1937.tb02153.x
12. C.R. Doering, C. Mueller, and P. Smereka, Physica (Amsterdam) 325A, 243 (2003). PHYADX 0378-4371 10.1016/S0378-4371(03)00203-6
13. P. Thévenaz, U. Ruttimann, and M. Unser, IEEE Trans. Image Process. IIPRE4 1057-7149 7, 27 (1998). 10.1109/83.650848
14. M. Döbeli, Nucl. Instrum. Methods Phys. Res., Sect. B 249, 800 (2006). NIMBEU 0168-583X 10.1016/j.nimb.2006.03.143 (Pubitemid 44037938)
15. L.R. Doolittle, Nucl. Instrum. Methods Phys. Res., Sect. B 15, 227 (1986). NIMBEU 0168-583X 10.1016/0168-583X(86)90291-0
16. M.A.N. Yongqiang Wang, Handbook of Modern Ion Beam 5 Materials Analysis (Materials Research, Warrendale, Pa., 2009).
17. A. Brink, Pattern Recogn. Lett. 9, 335 (1989). PRLEDG 0167-8655 10.1016/0167-8655(89)90062-7
18. W. van Saarloos, Phys. Rev. A 39, 6367 (1989). PLRAAN 0556-2791 10.1103/PhysRevA.39.6367
19. A. Lemarchand, A. Lesne, and M. Mareschal, Phys. Rev. E PLEEE8 1063-651X 51, 4457 (1995). 10.1103/PhysRevE.51.4457
20. G.C. Paquette, L.-Y. Chen, N. Goldenfeld, and Y. Oono, Phys. Rev. Lett. 72, 76 (1994). PRLTAO 0031-9007 10.1103/PhysRevLett.72.76
21. E. Brunet and B. Derrida, Europhys. Lett. 87, 60010 (2009). EULEEJ 0295-5075 10.1209/0295-5075/87/60010
22. H.P. McKean, Commun. Pure Appl. Math. 28, 323 (1975). CPMAMV 0010-3640 10.1002/cpa.3160280302
23. T. Ryll, H. Galinski, L. Schlagenhauf, F. Rechberger, Y. Sun, L.J. Gauckler, F.C.F. Mornaghini, Y. Ries, R. Spolenak, and M. Doebeli, arXiv:1108.5132.