Albumin adsorption on oxide thin films studied by spectroscopic ellipsometry

Applied Surface Science

Volumn 258, Issue 5, 2011, Pages 1711-1718

  Silva Bermudez, P ^a,b   Rodil, S E ^a   Muhl, S ^a  

^a INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

^b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Albumin; Ellipsometry; Metal oxide thin film; Protein adsorption

Indexed keywords

ADSORPTION; BIOCOMPATIBILITY; BODY FLUIDS; ELLIPSOMETRY; HYDROPHOBICITY; INTERFACIAL ENERGY; METALS; MICROSTRUCTURE; NIOBIUM OXIDE; OPTICAL PROPERTIES; OXIDE FILMS; PROTEINS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS; TANTALUM OXIDES; TITANIUM DIOXIDE; TITANIUM OXIDES; WETTING; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

ALBUMIN; BOVINE SERUM ALBUMINS; CHEMICAL COMPOSITIONS; METAL OXIDE THIN FILMS; PROTEIN ADSORPTION; PROTEIN CONCENTRATIONS; REACTIVE MAGNETRON SPUTTERING; SOLUTION CONCENTRATION;

THIN FILMS;

EID: 81555202462     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.10.020     Document Type: Article

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