Investigation of low cross section events in the RHBD/FT UT699 LEON 3FT

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2011, Pages 122-129

  Guertin, Steven M ^a   Hafer, Craig ^b   Griffith, Steve ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b Gaisler Research   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AEROFLEX; BAD DATA; CROSS SECTION; DATA CACHES; DISRUPTIVE EVENT; ERROR MODE; USER THREADS;

UNCERTAINTY ANALYSIS;

RADIATION EFFECTS;

EID: 81455142479     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2010.6062536     Document Type: Conference Paper

References (10)

1. S. Stratton, D. Stevenson, M. A. Johnson, "Rapid Development of Experimental LEON 3FT Controller Board", Small Satellites Conference 2009
2. C. Hafer, "Single Event Effects Qualification Summary for the UT699 LEON 3FT Processor", Aeroflex publication, 2008
3. Gaisler Reasearch/Aeroflex Gaisler, http://www.gaisler.com (01/2011)
4. J. Andersson, J. Gaisler, R. Weigand, "Next Generation Multipurpose Microprocessor", Data Systems in Aerospace 2010
5. C. Hafer, "Single Event Effects Qualification Summary for WX07A 0.25μm Test Chip", Aeroflex publication, 2004
6. C. Hafer, S. Griffith, S. Guertin, J. Nagy, F. Sievert, J. Gaiser, S. Habinc, "LEON 3FT Processor Radiation Effects Data", Radiation Effects Data Workshop, 2009
7. R.Koga, W.A.Kolasinski, M.T.Marra, W.A.Hanna, "Techniques of Microprocessor Testing and SEU-Rate Prediction," IEEE Trans. Nucl. Sci., 32(6), pp 4219-4224 (1985)
8. S. Guertin and F. Irom "Processor SEE Test Design", Single Event Effects Symposium (2009)
9. F.Irom, F.Farmanesh, A.Johnston, G.Swift, D.Millward, "Single-Event Upset in Commercial Silicon-on-Insulator PowerPC Microprocessors,"IEEE Trans. Nucl. Sci. 49(6), pp. 3148-3155 (2002)
10. F.Bezerra, J.Kuitunen, "Analysis of the SEU behavior of PowerPC 603R under heavy ions", Radiation and Its Effects on Components and Systems, Proceedings of the 7th European Conference on, 2003, Pp 289-293 (2003)