A 122 GHz multiprobe reflectometer for dielectric sensor readout in SiGe BiCMOS technology

Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC

Volumn , Issue , 2011, Pages

  Laemmle, Benjamin ^a   Schmalz, Klaus ^b   Scheytt, Christoph ^b   Kissinger, Dietmar ^a   Weigel, Robert ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b IHP   (Germany)

Author keywords

BiCMOS; Dielectric Sensor; Millimeter Wave; Network Analyzer; Reflectometer; SiGe; Six Port

Indexed keywords

BI-CMOS; DIELECTRIC SENSORS; NETWORK ANALYZER; SIGE; SIX-PORT;

BICMOS TECHNOLOGY; DIELECTRIC DEVICES; DIELECTRIC LIQUIDS; ELECTRIC NETWORK ANALYSIS; GALLIUM ARSENIDE; GALLIUM NITRIDE; INTEGRATED CIRCUITS; INTEGRATION; MILLIMETER WAVES; OSCILLISTORS; REFLECTOMETERS; SCATTERING PARAMETERS; SEMICONDUCTING GALLIUM; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SENSORS; SILICON ALLOYS;

ELECTRIC NETWORK ANALYZERS;

EID: 81455142395     PISSN: 15508781     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CSICS.2011.6062487     Document Type: Conference Paper

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