The influence of pixel numbers and image centring upon particle size analysis accuracy

Particle and Particle Systems Characterization

Volumn 27, Issue 3-4, 2010, Pages 71-75

  Wedd, Maurice ^a  

^a Orchard House   (United Kingdom)

Author keywords

accuracay; image analysis; reference materials

Indexed keywords

ACCURACAY; CERTIFIED REFERENCE MATERIALS; HANDLING TECHNIQUE; IMAGE ANALYSIS TECHNIQUES; LASER DIFFRACTIONS; MEASUREMENT ACCURACY; MONO-SIZED; PARTICLE SIZING; PARTICLE SIZING TECHNIQUES; PICKET FENCES; PIXEL ARRAYS; REFERENCE MATERIAL; REFERENCE METHOD; SPHERICAL PARTICLE; THRESHOLD LEVELS;

IMAGE ANALYSIS; MEASUREMENT ERRORS; PARTICLE SIZE; PIXELS;

PARTICLE SIZE ANALYSIS;

EID: 81355151648     PISSN: 09340866     EISSN: 15214117     Source Type: Journal    
DOI: 10.1002/ppsc.201100023     Document Type: Article

References (6)

1. W. Witt, T. Stübinger, J. Jordan, Improved Standards in Laser Diffraction. WCPT6, Nuremberg, 2010.
2. National Institute of Standards Technology, NIST, Gaithersburg, MD-20899, USA.
3. H. G. Merkus, Particle Size Measurement, Springer BV. 2009, p. 377.
4. Community Bureau for Reference Materials and Measurement (BCR), from Institute for Reference Materials and Measurement (IRMM), B-2440, Geel, Belgium.
5. ISO 14488: 2007, Particulate materials-Sampling and sample splitting for the determination of particulate properties.
6. M. W. Wedd, Procedure for Predicting a Minimum Volume or Mass of Sample to Provide a Given Size Parameter Precision. Part. Part. Syst. Charact. 2001, 18, 109-113. (Pubitemid 33046390)