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Volumn , Issue , 2011, Pages
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Influence of the trapezoidal cross-section of single and coupled inverted embedded microstrip lines on signal integrity
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Author keywords
[No Author keywords available]
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Indexed keywords
ADVANCED MODELING TECHNIQUES;
DIRICHLET-TO-NEUMANN;
EYE DIAGRAMS;
METALLIC CONDUCTOR;
MICROSTRIPES;
ON-CHIP INTERCONNECTS;
PER UNIT LENGTH;
SIGNAL INTEGRITY;
TIME-DOMAIN TRANSMISSION;
TRANSMISSION LINE PARAMETERS;
ASSEMBLY;
INDUSTRIAL ENGINEERING;
TIME DOMAIN ANALYSIS;
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EID: 81255154037
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/URSIGASS.2011.6050753 Document Type: Conference Paper |
Times cited : (7)
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References (5)
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