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Volumn , Issue , 2011, Pages

Influence of the trapezoidal cross-section of single and coupled inverted embedded microstrip lines on signal integrity

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED MODELING TECHNIQUES; DIRICHLET-TO-NEUMANN; EYE DIAGRAMS; METALLIC CONDUCTOR; MICROSTRIPES; ON-CHIP INTERCONNECTS; PER UNIT LENGTH; SIGNAL INTEGRITY; TIME-DOMAIN TRANSMISSION; TRANSMISSION LINE PARAMETERS;

EID: 81255154037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/URSIGASS.2011.6050753     Document Type: Conference Paper
Times cited : (7)

References (5)
  • 2
    • 47649131681 scopus 로고    scopus 로고
    • Quasi-TM Transmission Line Parameters of Coupled Lossy Lines Based on the Dirichlet to Neumann Boundary Operator
    • Jul.
    • T. Demeester and D. De Zutter, "Quasi-TM Transmission Line Parameters of Coupled Lossy Lines Based on the Dirichlet to Neumann Boundary Operator," IEEE Trans. Microw. Theory Tech., vol. 56, no. 7, pp. 1649-1660, Jul. 2008.
    • (2008) IEEE Trans. Microw. Theory Tech. , vol.56 , Issue.7 , pp. 1649-1660
    • Demeester, T.1    De Zutter, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.