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Volumn , Issue , 2011, Pages 292-296

Anecdotal experiences on the value of limited environmental testing for the analysis of "no Fault" Found assemblies

Author keywords

Diagnostic Strategies; Environmental Testing; Intermittent Circuit; No Fault Found

Indexed keywords

DIAGNOSTIC STRATEGY; ELECTRONIC ASSEMBLIES; INTERMITTENT CIRCUIT; NO FAULT FOUND; TEST SYSTEMS;

EID: 81055138988     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2011.6058733     Document Type: Conference Paper
Times cited : (1)

References (1)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.