Carbon nanotube electron source for field emission scanning electron microscopy

e-Journal of Surface Science and Nanotechnology

Volumn 9, Issue , 2011, Pages 400-403

  Nakahara, Hitoshi ^a   Ichikawa, Shunsuke ^a   Ochiai, Tomoya ^a   Kusano, Yoshikazu ^a   Saito, Yahachi ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Carbon nanotube; Field emission; Scanning electron microscopy (SEM)

Indexed keywords

CARBON NANOTUBES; ELECTRON GUNS; ELECTRON SOURCES; ELECTRONS; FIELD EMISSION; FIELD EMISSION MICROSCOPES; ION BEAMS; MULTIWALLED CARBON NANOTUBES (MWCN); SCANNING ELECTRON MICROSCOPY; TUNGSTEN; YARN;

EMISSION MATERIALS; EMISSION PROPERTIES; FIELD EMISSION ELECTRON SOURCES; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MULTI-WALLED NANOTUBES; NANOMANIPULATIONS; SINGLE-CRYSTALLINE;

ELECTRON EMISSION;

EID: 80955172365     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2011.400     Document Type: Conference Paper

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