Statistical analysis of multi-material components using dual energy CT

13th International Fall Workshop Vision, Modeling, and Visualization 2008, VMV 2008

Volumn , Issue , 2008, Pages 179-188

  Heinzl, Christoph ^a   Kastner, Johann ^a   Möller, Torsten ^a   Gröller, Eduard ^a  

^a UNIVERSITY OF APPLIED SCIENCES UPPER AUSTRIA   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION AREA; APPLICATION SCENARIO; ARTEFACT REDUCTION; DUAL EXPOSURES; DUAL-ENERGY CT; LOCAL HISTOGRAM; MATERIAL INTERFACES; MULTI MATERIALS;

COMPUTERIZED TOMOGRAPHY; MATERIALS; STATISTICAL METHODS; VISUALIZATION;

INTERFACES (MATERIALS);

EID: 80855143191     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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