Evidence of cation vacancy induced room temperature ferromagnetism in Li-N codoped ZnO thin films

Applied Physics Letters

Volumn 99, Issue 18, 2011, Pages

  Zhang, B Y ^a,b   Yao, B ^a,c   Li, Y F ^c,d   Liu, A M ^b   Zhang, Z Z ^a   Li, B H ^a   Xing, G Z ^c,d   Wu, T ^d   Qin, X B ^e   Zhao, D X ^a   Shan, C X ^a   Shen, D Z ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b DALIAN UNIVERSITY OF TECHNOLOGY   (China)

^c JILIN UNIVERSITY   (China)

^d NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^e INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CATION VACANCIES; CO-DOPED ZNO; DEFECT COMPLEX; FIRST-PRINCIPLES CALCULATION; LOW TEMPERATURE PHOTOLUMINESCENCE; P TYPE ZNO; P-TYPE; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; ROOM TEMPERATURE FERROMAGNETISM; ZNO;

CALCULATIONS; FERROMAGNETISM; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; OPTICAL FILMS; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; THIN FILMS; ZINC;

ZINC OXIDE;

EID: 80855141612     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3657412     Document Type: Article

References (20)

1. J. Pearton, W. H. Heo, M. Ivill, D. P. Norton, and T. Steiner, Semicond. Sci. Technol. 19, R59 (2004). 10.1088/0268-1242/19/10/R01
2. T. Dietl, H. Ohno, F. Matsukura, J. Cibert, and D. Ferrand, Science 287, 1019 (2000). 10.1126/science.287.5455.1019
3. S. M. Heald, T. Kaspar, T. Droubay, V. Shutthanandan, S. Chambers, A. Mokhtari, A. J. Behan, H. J. Blythe, J. R. Neal, A. M. Fox, and G. A. Gehring, Phys. Rev. B 79, 075202 (2009). 10.1103/PhysRevB.79.075202
4. T. S. Herng, S. P. Lau, L. Wang, B. C. Zhao, S. F. Yu, M. Tanemura, A. Akaike, and K. S. Teng, Appl. Phys. Lett. 95, 012505 (2009). 10.1063/1.3176434
5. G. Xing, D. Wang, J. Yi, L. Yang, M. Gao, M. He, J. Yang, J. Ding, T. C. Sum, and T. Wu, Appl. Phys. Lett. 96, 112511 (2010). 10.1063/1.3340930
6. I. S. Elfimov, A. Rusydi, S. I. Csiszar, Z. Hu, H. H. Hsieh, H. J. Lin, C. T. Chen, R. Liang, and G. A. Sawatzky, Phys. Rev. Lett. 98, 137202 (2007). 10.1103/PhysRevLett.98.137202
7. S. Chawla, K. Jayanthi, and R. K. Kotnala, Phys. Rev. B 79, 125204 (2009). 10.1103/PhysRevB.79.125204
8. J. B. Yi, C. C. Lim, G. Z. Xing, H. M. Fan, L. H. Van, S. L. Huang, K. S. Yang, X. L. Huang, X. B. Qin, B. Y. Wang, T. Wu, L. Wang, H. T. Zhang, X. Y. Gao, T. Liu, A. T. S. Wee, Y. P. Feng, and J. Ding, Phys. Rev. Lett. 104, 137201 (2010). 10.1103/PhysRevLett.104.137201
9. M. G. Wardle, J. P. Goss, and P. R. Briddon, Phys. Rev. B 71, 155205 (2005). 10.1103/PhysRevB.71.155205
10. B. Y. Zhang, B. Yao, Y. F. Li, Z. Z. Zhang, B. H. Li, C. X. Shan, D. X. Zhao, and D. Z. Shen, Appl. Phys. Lett. 97, 222101 (2010). 10.1063/1.3518059
11. M. A. Garcia, E. F. Pinel, J. de la Venta, A. Quesada, V. Bouzas, J. F. Fernndez, J. J. Romero, M. S. M. Gonzlez, and J. L. Costa-Krmer, J. Appl. Phys. 105, 013925 (2009). 10.1063/1.3060808
12. T. T. Zhao, T. Yang, B. Yao, C. X. Cong, Y. R. Sui, G. Z. Xing, Y. Sun, S. C. Su, H. Zhu, and D. Z. Shen, Thin Solid Films 518, 3289 (2010). 10.1016/j.tsf.2009.09.008
13. D. C. Look, D. C. Reynolds, C. W. Litton, R. L. Jones, D. B. Eason, and G. Cantwell, Appl. Phys. Lett. 81, 1830 (2002). 10.1063/1.1504875
14. B. X. Lin, Z. X. Fu, and Y. B. Jia, Appl. Phys. Lett. 79, 943 (2001). 10.1063/1.1394173
15. M. Schirra, R. Schneider, A. Reiser, G. M. Prinz, M. Feneberg, J. Biskupek, U. Kaiser, C. E. Krill, K. Thonke, and R. Sauer, Phys. Rev. B 77, 125215 (2008). 10.1103/PhysRevB.77.125215
16. F. Tuomisto, V. Ranki, D. C. Look, and G. C. Farlow, Phys. Rev. B 76, 165207 (2007). 10.1103/PhysRevB.76.165207
17. L. Liszkay, C. Corbel, and L. Baroux, Appl. Phys. Lett. 64, 1380 (1994). 10.1063/1.111994
18. A. L. Yang, H. P. Song, D. C. Liang, H. Y. Wei, X. L. Liu, P. Jin, X. B. Qin, S. Y. Yang, Q. S. Zhu, and Z. G. Wang, Appl. Phys. Lett. 96, 151904 (2010). 10.1063/1.3394012
19. Y. F. Li, R. Deng, B. Yao, G. Z. Xing, D. D. Wang, and T. Wu, Appl. Phys. Lett. 97, 102506 (2010). 10.1063/1.3485058
20. D. Q. Fang, A. L. Rosa, R. Q. Zhang, and Th. Frauenheim, J. Phys. Chem. C 114, 5760 (2010). 10.1021/jp909937u