Fe/BaTiO3 interface: Band alignment and chemical properties

Applied Physics Letters

Volumn 99, Issue 18, 2011, Pages

  Zenkevich, A ^a,b   Mantovan, R ^c   Fanciulli, M ^c,d   Minnekaev, M ^a   Matveyev, Yu ^a   Lebedinskii, Yu ^a,b   Thiess, S ^e   Drube, W ^e  

^a NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI   (Russian Federation)

^b KURCHATOV INSTITUTE   (Russian Federation)

^c LABORATORIO MDM   (Italy)

^d UNIVERSITY OF MILANO BICOCCA   (Italy)

^e DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; BAND ALIGNMENTS; BILAYER; CONDUCTION BAND OFFSET; CONVERSION ELECTRONS; ELECTRONIC BAND STRUCTURE; GROWTH CONDITIONS; HARD X-RAY PHOTOEMISSION SPECTROSCOPY; INTERFACE STRUCTURES; INTERFACE-SENSITIVE; MAGNETICALLY DEAD LAYER; SRTIO; ULTRA-THIN;

ATOMIC SPECTROSCOPY; BARIUM COMPOUNDS; CHEMICAL PROPERTIES; ELECTRON MOBILITY; EMISSION SPECTROSCOPY; PULSED LASER DEPOSITION;

ALIGNMENT;

EID: 80855128079     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3657769     Document Type: Article

References (20)

1. C.-G. Duan, S. S. Jaswal, and E. Y. Tsymbal, Phys. Rev. Lett. 97, 047201 (2006). 10.1103/PhysRevLett.97.047201
2. C.-G. Duan, J. P. Velev, R. F. Sabirianov, W. N. Mei, S. S. Jaswal, and E. Y. Tsymbal, Appl. Phys. Lett. 92, 122905 (2008). 10.1063/1.2901879
3. J. Lee, N. Sai, T. Cai, Q. Niu, and A. Demkov, Phys. Rev. B 81, 144425 (2010). 10.1103/PhysRevB.81.144425
4. S. Sahoo, S. Polisetty, C.-G. Duan, S. S. Jaswal, E. Y. Tsymbal, and C. Binek, Phys. Rev. B 76, 092108 (2007). 10.1103/PhysRevB.76.092108
5. S. Brivio, D. Petti, R. Bertacco, and J. C. Cezar, Appl. Phys. Lett. 98, 092505 (2011). 10.1063/1.3554432
6. V. Garcia, M. Bibes, L. Bocher, S. Valencia, F. Kronast, A. Crassous, X. Moya, S. Enouz-Vedrenne, A. Gloter, D. Imhoff, C. Deranlot, N. D. Mathur, S. Fusil, K. Bouzehouane, and A. Barthélémy, Science 327, 1106 (2010). 10.1126/science.1184028
7. S. Valencia, A. Crassous, L. Bocher, V. Garcia, X. Moya, R. O. Cherifi, C. Deranlot, K. Bouzehouane, S. Fusil, A. Zobelli, A. Gloter, N. D. Mathur, A. Gaupp, R. Abrudan, F. Radu, A. Barthélémy, and M. Bibes, Nature Mater. 10, 753 (2011). 10.1038/nmat3098
8. 3/Fe bi-layers: structural characterization and piezoelectric response, Thin Solid Films (to be published).
9. V. M. Pessa, Phys. Rev. B 15, 1223 (1977). 10.1103/PhysRevB.15.1223
10. S. Doniach and M. Sunjic, J. Phys. C 3, 285 (1970). 10.1088/0022-3719/3/ 2/010
11. S. Tougaard and B. Jrgensen, Surf. Int. Anal. 7, 17 (1985). 10.1002/sia.v7:1
12. R. Mantovan and M. Fanciulli, Rev. Sci. Instrum. 78, 063902 (2007). 10.1063/1.2745654
13. E. Kuzman, S. Nagy, and A. Vértes, Pure Appl. Chem. 75 (6), 801 (2003). 10.1351/pac200375060801
14. E. A. Kraut, R. W. Grant, J. R. Waldrop, and S. P. Kowalczyk, Phys. Rev. Lett. 44, 1620 (1980). 10.1103/PhysRevLett.44.1620
15. C. H. Jia, Y. H. Chen, X. L. Zhou, A. L. Yang, G. L. Zheng, X. L. Liu, S. Y. Yang, and Z. G. Wang, Appl. Phys. A 99, 511 (2010). 10.1007/s00339-010-5599- y
16. S. H. Wemple, Phys. Rev. B 2, 2679 (1970). 10.1103/PhysRevB.2.2679
17. H. Guo, L. Liu, Zh. Chen, S. Ding, H. Lu, K. Jin, Y. Zhou, and B. Cheng, Europhys. Lett. 73, 110 (2006). 10.1209/epl/i2005-10360-3
18. Y. K. Vayunandana Reddy, D. Mergel, S. Reuter, V. Buck, and M. Sulkowski, J. Phys. D: Appl. Phys. 39, 1161 (2006). 10.1088/0022-3727/39/6/023
19. M. Dawber, K. M. Rabe, and J. F Scott, Rev. Mod. Phys. 77, 1083 (2005). 10.1103/RevModPhys.77.1083
20. M. Dawber and J. F Scott, Integr. Ferroelectr. 38, 161 (2001). 10.1080/10584580108016929